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  • Contact type resistance measurement
    Contact type resistance measurement instruments;
    - Uses a 4-point(or 2-point) probe head to contact to the sample for the measurement.
    - Wide measurement range
    - Suitable for a various samples.
  • Non-Contact type resistance measurement
    Non-Contact type resistance measurement instruments;
    - Paired eddy-current probe head for measurement
    - Non-Damege measurement by non-contact measurement
  • Flatness/Thickness measurement
    Flatness/Thickness measurement instruments;
    - Wafer flatness(TTV, BOW, WARP) & thickness measurement by non-contact.
  • > Lineups
  • NAPSON CORPORATION
  • NAPSON KOREA
  • QUATEK