PRODUCTS

Resistance measurement

Contact type resistance measurement
Contact type resistance measurement
  • Uses a 4 point(or 2 point) probe head to contact to the sample for the measurement.
  • Wide measurement range
  • Suitable for a various samples.
Non-Contact type resistance measurement
Non-Contact type resistance measurement
  • Paired eddy-current probe head for measurement
  • Non-Damage measurement by non-contact measurement

Other Products

Flatness/Thickness measurement
Flatness/Thickness measurement
Lifetime measurement
Lifetime measurement
Spreading resistance measurement
Spreading resistance measurement
PN type checker
PN type checker
4 point probe head
4 point probe head
Resistivity Reference wafer
Resistivity Reference wafer

Measurement Range

ONLY Napson manufactures both Contact and Non-contact resistivity measurement systems.
Please refer to the tables below for features & resistivity ranges of each measurement type.
For additional information, please contact us by the Contact form.

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Contact type
[4 point probe method] 		Non-contact type
[Eddy-current method]
Measurement area 3mm（or 1.5～4.77mm） Φ5～60mm
Probe Gap
(*Determined by test sample thickness)		 Contact 0.1～10mm
Advantage
  • Measurement is absolute
  • Narrow measurement area
  • No damage by contact
  • No influence of contact resistance
Disadvantage
  • Sample may be damaged by probe contact
  • Calibration to a reference resistivity sample is required
  • Sample thickness is limited by probe gap

Measurement range by each method

Measurement range by each method
Measurement range chart
Measurement Principles & PDF Download