PRODUCTS

Lifetime measurement

HF-90R
Life-time measurement system for silicon bulks / ingots with non-contact

Selling Points

1POINT

NON-Contact type

PC & Software

Silicon bulk, Prismatic shape (JIS code), Ingot condition
Non-contact photoconduction vibration decay method
Data processing by digital oscilloscope and PC with software

Details

Applications

• Silicon ingot, Silicon bulk, Prismatic shape (JIS code)

Sample sizes

*Please contact us in details

Measuring range

100 ~ 5,000μS (in the range of 10 ~ 5,000Ω・cm)

HF-100DCA
Life-time measurement system for silicon bulks/ingots by JIS method

Selling Points

1POINT

Contact type

PC & Software

Global standard model for the lifetime test of silicon bulk
JIS direct current anodizing method
Data processing by digital oscilloscope and PC with software

Details

Applications

• Silicon ingot, Silicon bulk, Prismatic shape (JIS code)

Sample sizes

*Please contact us in details

Measuring range

50μS~ 20mS

Product Information

Products Lineups

• Contact type resistance measurement
• Non-Contact type resistance measurement
• Lifetime measurement
• Flatness/Thickness measurement
• Spreading resistance measurement
• PN type checker
• 4 point probe head
• Resistivity Reference wafer