The pioneer
in the resistivity /
sheet resistance metrology.

NAPSON CORPORATION
Products
Contact type

Contact type
Non-Contact type

Non-Contact
type
Technical Info

Technical Info
Inquiry

Inquiry

Napson is a global leading developer and manufacturer of resistivity and sheet resistance measurement equipment for the semiconductor industry, utilizing four-point probes and non-contact eddy current measurement.

Company Worldwide Inquiry

PRODUCTS

Contact Type
WS-8800
WS-8800

Fully automatic sorting system with transport robot by 4 point probe method
Contact Type
RT-3000/RG-2000AL (RG-3000AL)
RT-3000/RG-2000AL (RG-3000AL)

Fully automatic system with one cassette station by 4 point probe method
Contact Type
RT-3000/RS-1300
RT-3000/RS-1300

Global standard fully automatic measurement system in the flat panel field by 4 point probe method
Non-Contact type
NC-6800
NC-6800

Fully automatic belt transfer sorting system by eddy current method
Non-Contact type
NC-2000FLA
NC-2000FLA

Fully automatic robot transfer sorting system of resistivity and flatness by eddy current/capacitance method
Non-Contact type
NC-600MAP
NC-600MAP

Measurement system with one cassette station of sesistivity / sheet resistnace by eddy current method
Contact Type
Cresbox
Cresbox

Semi-automatic / small foot print measuring instrument of resistivity / sheet resistance by 4 point probe method
Contact Type
RT-3000/RG-2000 (RG-3000)
RT-3000/RG-2000 (RG-3000)

Semi-automatic / wide range measuring instrument of resistivity / sheet resistance by 4 point probe method
Contact Type
RG-200PV
RG-200PV

Semi-automatic measuring instrument of resistivity / sheet resistance for solar cell by 4 point probe method
Non-Contact type
NC-80MAP
NC-80MAP

Semi-automatic / wide range measuring instrument of resistivity / sheet resistance by eddy current method
Non-Contact type
CRN-100
CRN-100

Semi-automatic measuring instrument of Ultra-high range sheet resistance by corona discharge method
Contact Type
RT-70V series
RT-70V series

Simple measuring instrument of resistivity/sheet resistance by 4 point probe method
Contact Type Non-Contact Type
DUORES
DUORES

Handy type sheet resistance measuring tool [compatible both 4 point probe method and non-destructive (eddy current method) probes]
Non-Contact type
EC-80
EC-80

Handy type measuring tool of resistivity / sheet ressistance by eddy current method (Non-damage)
Non-Contact type
EC-80P (Portable)
EC-80P (Portable)

Handy type measuring tool of resistivity / sheet ressistance by eddy current method (Non-damage)
Non-Contact type
PVE-80
PVE-80

Simple measuring instrument for ultra low measurement range by pulse-Voltage excitation method (Non-contact)
Contact Type
TCR-600
TCR-600

Resistivity measuring instrument with temperature control system by 4 point probe method
Products
Products
  • Sheet resistance/resistivity measurement
  • Flatness/Thickness measurement / Lifetime measurement / Spreading resistance measurement
  • PN type checker / 4 point probe head / Resistivity Reference wafer
  • Measurement Range
Lineups

OTHER PRODUCTS

Contact Us

You are welcome to contact us for further details of our products. We will offer you the best solution according to your request.

Contact Us

Since 1984, Napson has been developing and manufacturing resistivity/sheet resistance measurement instruments for semiconductor and thin-film materials.

Company
Our vision
Worldwide

DOWNLOAD DOCUMENTS Measurement principles & methods of Resistance

NEWS & TOPICS

NEWS & TOPICS
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Measurement Principles