4-point probe head

4-point probe head
Cartridge type, Cylindrical type, Miniature type, Cartridge with 6-way connector socket type

4-point probe head

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  • 4-point probe head
  • 4-point probe head
  • 4-point probe head
  • 4-point probe head

Selling Points

Napson 4-point resistivity / sheet resistance systems are using high performance probe heads which are made by Jandel Engineering Limited of England.

Jandel probe head performs high precise measurement of resistivity and sheet resistance for silicon wafers, epitaxial layers, diffusion layers, ITO layers, metal layers and more, so that Jandel probes have a good evaluation for many years.

*Load (needle pressure) is always suitable since using V type spring
*Probe spacing accuracy and probe stability is excellent since anodized aluminum alloy upper and lower guides are jeweled
*Less damage of probe needle tips – Solid tungsten carbide needles for superior durability

Details

Applications

The probe type is chosen under the material of measuring sample, the surface state, the form etc.

 

Measurement sample  Probe head
(Material/Radius)
Load/Needle
Silicon Ingots / Block  TC-40u  200g
Silicon Slice  TC-40u  200g
Epitaxial Layers  TC-150u  100g
Epitaxial Layers (Thin film)  TC-150u, 500u  50g
Shallow Diffused -layers (Thin film)  OS-200u, 500u  50g
Diffused Layers  OS-200u, TC-150u  100g
Ion Implantation  TC-150u  50g, 100g
Metal (Thin film)  TC-150u, 500u  25g, 50g, 100g
ITO layer  TC-150u, 500u  25g, 50g, 100g

 

*The other types are available.

*If you would like to have a special spec, contact us.

<Specifications>
e.g) TC-40u-200g/1.00mm
– Needle Material: TC [Tungsten carbide] (or  OS: Osmium alloy)
– Radius:  40 um   (25 um to 500 um)
– Loads (g/needle): 200g (10g to 250g)
– Spacing: 1.00 mm  (0.5 mm to 1.59 mm)
– Arrangement: Linear (standard) (Square is available)