Life-time measurement system for silicon bulks / ingots with non-contact
HF-90R
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Selling Points
- Silicon bulk, Prismatic shape (JIS code), Ingot condition
- Non-contact photoconduction vibration decay method
- Data processing by digital oscilloscope and PC with software
Details
Applications
Silicon ingot, Silicon bulk, Prismatic shape (JIS code)
Sample sizes
*Please contact us in details
Measuring range
100 ~ 5,000μS (in the range of 10 ~ 5,000Ω・cm)
Life-time measurement system for silicon bulks/ingots by JIS method
HF-100DCA
Image of Product
Selling Points
- Global standard model for the lifetime test of silicon bulk
- JIS direct current anodizing method
Data processing by digital oscilloscope and PC with software
Details
Applications
Silicon ingot, Silicon bulk, Prismatic shape (JIS code)
Sample sizes
*Please contact us in details
Measuring range
