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Lifetime measurement

Life-time measurement system for silicon bulks / ingots with non-contact

HF-90R

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  • Lifetime measurement

Selling Points

  • Silicon bulk, Prismatic shape (JIS code), Ingot condition
  • Non-contact photoconduction vibration decay method
  • Data processing by digital oscilloscope and PC with software

Details

Applications

Silicon ingot, Silicon bulk, Prismatic shape (JIS code)

Sample sizes

*Please contact us in details

Measuring range

100 ~ 5,000μS (in the range of 10 ~ 5,000Ω・cm)

Life-time measurement system for silicon bulks/ingots by JIS method

HF-100DCA

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  • Lifetime measurement

Selling Points

  • Global standard model for the lifetime test of silicon bulk
  • JIS direct current anodizing method
    Data processing by digital oscilloscope and PC with software

Details

Applications

Silicon ingot, Silicon bulk, Prismatic shape (JIS code)

Sample sizes

*Please contact us in details

Measuring range

50 μS~ 20mS