Spreading resistance measurement

Spread resistance for slanting polished sample of semiconductor by tow kinematically-mounted probe contacting .

SRS-2010

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  • Spreading resistance measurement
  • Spreading resistance measurement

Selling Points

Resitivity map along with depth direction, thickness of epitaxial , depth of PN junctin and carier density profiles

Details

Applications

Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)

Sample sizes

Please contact us in details

Measuring range

 1~10E+9 Ω[Spread restance]

Carrier density range:2E+13 ~ 5E+19 cm2 [N-type silicon]
2E+14 ~ 7E+19 cm2  [P-type silicon]