PRODUCTS

SRS-2010
Spread resistance for slanting polished sample of semiconductor by tow kinematically-mounted probe contacting

Selling Points

1POINT

Contact type

PC & Software

Resitivity map along with depth direction, thickness of epitaxial , depth of PN junctin and carier density profiles

Details

Applications

• Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)

Sample sizes

Please contact us in details

Measuring range

1~10E+9 Ω[Spread restance]

Carrier density range:2E+13 ~ 5E+19 cm2 [N-type silicon]
2E+14 ~ 7E+19 cm2 [P-type silicon]

Product Information

Products Lineups

• Contact type resistance measurement
• Non-Contact type resistance measurement
• Lifetime measurement
• Flatness/Thickness measurement
• Spreading resistance measurement
• PN type checker
• 4 point probe head
• Resistivity Reference wafer