Built-in module

Non-contact Inline resistivity measurement module

NC-110 (NC-110PV)

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  • Built-in module
  • Built-in module

Selling Points

  • Possible to measure sheet resistance without contact by Max. 3 types of probes
  • Suitable for production line and tranceportation system
  • Connect to host PC by LAN to send measurement command and data

Details

Applications

  • Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)
  • New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
  • Conductive thin film (Metal, ITO etc)
  • Silicon-related epitaxial materials, Ion-implantation sample
  • Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc)
  • Others (*Please contact us for details)

Sample sizes

2 ~ 8 inch, ~156x156mm (Option; ~12 inch, ~210x210mm)

Measuring range

[R] 1m ~ 200 Ω・cm (NC-110PV : 0.2 ~ 20 Ω・cm for solar wafer)

[RS] 10m ~ 3,000 Ω/sq

* The range is separated from each Low, Middle, High and S-High probe type.

*Please refer the measurement range for each probe type as below;
1 Low : 0.01~0.5Ω/□ (0.001~0.05Ω‐cm)
2 Middle : 0.5~10Ω/□ (0.05~0.5Ω‐cm)
3 High : 10~1000Ω/□ (0.5~60Ω‐cm)
4 S-High : 1000~3000Ω/□ (60~200Ω‐cm)

Related product

Resistivity + Thickness measurement module : NC-110-T, NC-110PV-T

Non-contact Inline sheet resistance measurement module for flat panel display

NC-600

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  • Built-in module

Selling Points

  • Non-stop and non-contact sheet resistance measuring of thin film on glass runs through on conveyer
  • 1 to 10 number of probe by sizes of glass is attachable
  • Glass collision prevention function
  • Continuous test data report to the host computer

 

Details

Applications

  • New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
  • Conductive thin film (Metal, ITO etc)

Sample sizes

~ 2,880 x 3,080mm

Measuring range

10~1000Ω/sq [Standard range type]

(* Select a range from 1m ~2000 Ω/sq. Please contact us in details)

*Numbers of probe module : Selectable

Non-contact Inline sheet resistance measurement module for Conductive layer on substrate

NC-700

Image of Product

  • Built-in module

Selling Points

  • Inline measurement module for moving substrates such as PET film, glass or paper
  • Continuous measurement(~24h) in Roll to Roll with OFF-SET FREE capability system
  • Various applications from the research and development to the production line

 

Details

Applications

  • New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
  • Conductive thin film (Metal, ITO etc)

Sample sizes

Please contact us in details

Measuring range

10~1000Ω/sq [Standard range type]

(* Select a range from 1m ~2000 Ω/sq. Please contact us in details)

*Numbers of probe module : Selectable

Related product

For vacuum chamber environment : NC-700V
Adding transmittance measurement function : NC-700+TR

Leaflet

(日本語)

*Please download leaflet as followings.

Download